{
    "id": "ted:631856-2026",
    "url": "https://outfortender.com/tender/ted-631856-2026",
    "official_notice": "https://ted.europa.eu/en/notice/631856-2026/html",
    "title": "Semi-automatic prober for characterization of 200 mm wafers",
    "titles": {
        "de": "Semi-automatic prober for characterization of 200 mm wafers"
    },
    "description": "Supply, delivery, installation, commissioning and integration of a semi-automatic wafer prober system for the electrical and temperature-dependent characterization of 200 mm wafers. The system shall support DC and pulsed I-V as well as low-frequency impedance measurements up to 10 MHz and shall be integrated with the existing Keithley 4200A-SCS characterization system. The scope includes the prober, temperature-controlled chuck, electrical probes, optical and camera systems, control hardware and software, cabling and interfaces, installation, commissioning, operator training and integration support.",
    "description_language": "de",
    "buyer": "IHP GmbH - Leibniz-Institut für innovative Mikroelektronik",
    "country": "DE",
    "country_name": "Germany",
    "category": "Laboratory, optical and precision equipment",
    "cpv": "38540000",
    "procedure": "open",
    "published": "2026-09-14",
    "deadline": "2026-10-13T12:00:00+02:00",
    "status": "open",
    "source": "ted"
}