{
    "id": "ted:713490-2026",
    "url": "https://outfortender.com/tender/ted-713490-2026",
    "official_notice": "https://ted.europa.eu/en/notice/713490-2026/html",
    "title": "The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source",
    "titles": {
        "en": "The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source"
    },
    "description": "DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS.",
    "description_language": "en",
    "buyer": "Danmarks Tekniske Universitet - DTU",
    "country": "DK",
    "country_name": "Denmark",
    "category": "Laboratory, optical and precision equipment",
    "cpv": "38511100",
    "procedure": "open",
    "published": "2026-10-15",
    "deadline": "2026-11-16T07:00:00Z",
    "status": "open",
    "source": "ted"
}