Out For Tender › Denmark › Laboratory, optical and precision equipments (excl. glasses)
The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source
- Buyer
- Danmarks Tekniske Universitet - DTU
- Country
- Denmark
- Category
- Laboratory, optical and precision equipments (excl. glasses)
- Deadline
- Closes in 22 days (16 Nov 2026 07:00 UTC+0)
- Published
- 15 Oct 2026
- Procedure
- Open
- CPV code
- 38511100
Read the official notice and bid → Bidding always happens on the buyer's own portal, never here.
What the buyer is asking for
DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS.
Source: TED · reference 713490-2026 · JSON